Crystal Blank Appearance Checker (オーキット材料システム株式会社) のカタログ情報
Crystal Blank Appearance Checker
製品個別カタログ
カタログ紹介
Crystal Blank Appearance Checker
1. Uses
Polished or beveled Crystal blank
2. Futures
・The appearance defects of x’tal blanks or wafers such as chips, scratches, crack, stains and bevel differences are visible clearly as the color differences.
・Regardless of the size and the surface roughness, the hidden defects on the back side are a visible.
・The conventional reflection method is optioned and the both methods could be switched easily.
・Depending to the specification (the width and the depth etc.) of the defects, the lens magnification or the stage could be chosen freely.
1. Uses
Polished or beveled Crystal blank
2. Futures
・The appearance defects of x’tal blanks or wafers such as chips, scratches, crack, stains and bevel differences are visible clearly as the color differences.
・Regardless of the size and the surface roughness, the hidden defects on the back side are a visible.
・The conventional reflection method is optioned and the both methods could be switched easily.
・Depending to the specification (the width and the depth etc.) of the defects, the lens magnification or the stage could be chosen freely.
カタログについて
- カタログ名
- Crystal Blank Appearance Checker
- 取り扱い企業
- オーキット材料システム株式会社
- カタログタイプ
- 製品個別カタログ
